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unittests: Add more coverage corner cases for BIT STRINGs

This commit is contained in:
Jakub Jelen 2019-11-06 17:57:35 +01:00
parent 8ddfafe057
commit e8af4fc167
1 changed files with 12 additions and 0 deletions
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12
src/tests/unittests/asn1.c
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@ -212,12 +212,16 @@ TORTURE_INTEGER(negative, "\xff\x20", -224)
assert_int_equal(rv, error); \ assert_int_equal(rv, error); \
} }
/* Without the Tag (0x03) and Length */ /* Without the Tag (0x03) and Length */
/* Simple value 0 */
TORTURE_BIT_FIELD(zero, "\x07\x00", 0)
/* Simple value 1 */ /* Simple value 1 */
TORTURE_BIT_FIELD(one, "\x07\x80", 1) TORTURE_BIT_FIELD(one, "\x07\x80", 1)
/* This is the last value that can be represented in the unsigned int */ /* This is the last value that can be represented in the unsigned int */
TORTURE_BIT_FIELD(uint_max, "\x00\xff\xff\xff\xff", UINT_MAX) TORTURE_BIT_FIELD(uint_max, "\x00\xff\xff\xff\xff", UINT_MAX)
/* Valid padding */ /* Valid padding */
TORTURE_BIT_FIELD(padding, "\x01\xfe", 127) TORTURE_BIT_FIELD(padding, "\x01\xfe", 127)
/* Empty bit field needs zero padding */
TORTURE_BIT_FIELD(zero_only, "\x00", 0)
/* Negative test cases */ /* Negative test cases */
/* Too large unused bits field */ /* Too large unused bits field */
@ -226,6 +230,10 @@ TORTURE_BIT_FIELD_ERROR(large_unused_bits, "\x20\xff\xff\xff\xff", SC_ERROR_INVA
TORTURE_BIT_FIELD_ERROR(too_large, "\x00\xff\xff\xff\xff\xff", SC_ERROR_BUFFER_TOO_SMALL) TORTURE_BIT_FIELD_ERROR(too_large, "\x00\xff\xff\xff\xff\xff", SC_ERROR_BUFFER_TOO_SMALL)
/* Invalid (non-zero bits) padding */ /* Invalid (non-zero bits) padding */
TORTURE_BIT_FIELD_ERROR(invalid_padding, "\x01\xff", SC_ERROR_INVALID_ASN1_OBJECT) TORTURE_BIT_FIELD_ERROR(invalid_padding, "\x01\xff", SC_ERROR_INVALID_ASN1_OBJECT)
/* Empty bit field with non-zero zero-bits */
TORTURE_BIT_FIELD_ERROR(zero_invalid, "\x07", SC_ERROR_INVALID_ASN1_OBJECT)
/* Empty BIT FIELD is not valid */
TORTURE_BIT_FIELD_ERROR(empty, "", SC_ERROR_INVALID_ASN1_OBJECT)
int main(void) int main(void)
@ -262,12 +270,16 @@ int main(void)
cmocka_unit_test(torture_asn1_oid_non_minimal), cmocka_unit_test(torture_asn1_oid_non_minimal),
cmocka_unit_test(torture_asn1_oid_non_minimal_second), cmocka_unit_test(torture_asn1_oid_non_minimal_second),
/* BIT FIELD */ /* BIT FIELD */
cmocka_unit_test(torture_asn1_bit_field_zero),
cmocka_unit_test(torture_asn1_bit_field_one), cmocka_unit_test(torture_asn1_bit_field_one),
cmocka_unit_test(torture_asn1_bit_field_uint_max), cmocka_unit_test(torture_asn1_bit_field_uint_max),
cmocka_unit_test(torture_asn1_bit_field_padding), cmocka_unit_test(torture_asn1_bit_field_padding),
cmocka_unit_test(torture_asn1_bit_field_zero_only),
cmocka_unit_test(torture_asn1_bit_field_large_unused_bits), cmocka_unit_test(torture_asn1_bit_field_large_unused_bits),
cmocka_unit_test(torture_asn1_bit_field_too_large), cmocka_unit_test(torture_asn1_bit_field_too_large),
cmocka_unit_test(torture_asn1_bit_field_invalid_padding), cmocka_unit_test(torture_asn1_bit_field_invalid_padding),
cmocka_unit_test(torture_asn1_bit_field_zero_invalid),
cmocka_unit_test(torture_asn1_bit_field_empty),
}; };
rc = cmocka_run_group_tests(tests, NULL, NULL); rc = cmocka_run_group_tests(tests, NULL, NULL);